EQU-18683 - USA (Lemont, Illinois) - Automatic Thin Film Mapping Tool - Deadline June 29,2026

– Vendor needs to provide automatic thin film mapping tool to the government authority located in Lemont, IL.    – The system must include an integrated automatic wavelength calibration system, without requiring user intervention, external standards, or factory recalibration.– The mapping system must be flexible enough to process a wide variety of substrates from 5x5mm piece to a 200mm wafer.– The software shall retain the full measurement spectrum and analysis results for at least the previous 500 measurements, allowing for re–analysis of historical data without requiring re–measurement of samples– The tool should support patterned (pattern recognition – die based) and un–patterned samples.   – Windows 11 compatible.– Software must have multiple layers of user accounts.– Pattern recognition of a 150mm Silicon wafer.– User account management.– Thin film measurement.