NPP - Electron Backscatter Diffraction (EBSD) Detector

Trade Agreement: CFTA, Canada-Chile Free Trade Agreement, Canada-Colombia Free Trade agreement, Canada-Honduras Free Trade Agreement, Canada-Korea Free Trade Agreement, Canada-Panama Free Trade Agreement. Tendering Procedures: to all pre-qualified suppliers under the Supply Arrangement E60PV-19EQUI under Crystallography Equipment. Competitive Procurement Strategy: Lowest cost Comprehensive Land Claim Agreement: No Nature of Requirements: Electron Backscatter Diffraction (EBSD) Detector THIS REQUEST IS RESERVED FOR HOLDERS OF SUPPLY ARRANGEMENT # E60PV-19EQUI ONLY, FOR THE PURCHASE OF LABORATORY AND SCIENTIFIC EQUIPMENT, PARTS AND ACCESSORIES, SERVICES AND SUPPLIES. Only Suppliers currently pre-qualified on Supply Arrangement E60PV-19EQUI have been invited to bid. As a requirement of the Supply Arrangement, this notice is published on Government Electronic Tendering Service (GETS) for a period of 40 calendar days. The closing date published on this notice identifies how long the notice will be published. For the closing date of any solicitation under the supply arrangement, invited suppliers should refer to the solicitation documents. Suppliers that do not have a Supply Arrangement for the supply of Laboratory and Scientific Equipment, Parts and Accessories, Services and Supplies with Public Works and Government Services Canada, cannot submit a bid. Any bids received from suppliers not pre-qualified on the Supply Arrangement will not be evaluated. Suppliers may qualify under Supply Arrangement E60PV-19EQUI for Laboratory and Scientific Equipment, Parts and Accessories, Services and Supplies, at any time. Interested suppliers should download solicitation document E60PV-19EQUI/D from CanadaBuys (SAP Ariba) and submit a response as per the requirements of the Request for Supply Arrangement. Item : Electron Backscatter Diffraction (EBSD) Detector Quantity: 1 The mandatory technical criteria are: # MANDATORY TECHNICAL CRITERIA M1 Must be capable of being installed on a TESCAN Mira3 XMH model scanning electron microscope M2 Must come equipped with a CMOS sensor, a phosphor screen, and fibre-optic coupling M3 Must be capable of collecting EBSD patterns with image sizes up to 1244x1024 M4 Must have pattern acquisition speeds of up to 5700 patterns per second at 156x128 resolution M5 Must allow analyses at beam currents as low as 400 pA and accelerating voltages as low as 5kV M6 Must be capable of angular resolution up to 0.05 degrees M7 Must have motorized screen elevation control and insertion/retraction control M8 Must come equipped with a 5 diode forescatter diode (FSD) array for orientation contrast, topographic contrast, and atomic number contrast imaging M9 Must come with a Windows PC workstation installed with software for data acquisition and processing. M10 Must be capable of simultaneous EDS/EBSD mapping with an X-Max 80 model EDS detector, permitting refined phase identification using sample chemistry. Note: The X-Max 80 is the exact model of EDS detector currently installed in the laboratory. We rely on a function where simultaneously collected EDS data is used to aid in the correct identification of crystallographically similar phases during automated EBSD analyses, and therefore any new EBSD detector must be compatible with our X-Max 80.